This two day seminar will provide engineers, operators and technicians with the use of basic and advanced Statistical Process Control methods using Qualitran's SPC/PI+ software.  Topics covered include a review of basic Statistical Process Control, Process Capability, Measurement System Analysis, enumerative statistics,  advanced control charty such as CUSUM, EWMA and treatment of Non Normal data, autocorrelation and a thorough tutorial on use of the software for control and improvement.  Participants will use the software to analyze data from their work in workshops spread throughout the session. Upon completion of this seminar participants will be able to successfully implement SPC in their processes using these  techniques.

Seminar Outline

1.  Review of  Statistical Process Control  PrinciplesThe Systems Approach, Quality Definition, Process Problems, Management's Role, Statistical Process Control  Activity, Techniques, Benefits. 

2. Review of Basic Statistical Process Control  & Use of SPC/PI+ Software
Variation, Histograms, Basic descriptive statistics, Cp, Cpk, Cpm, SPC/PI+ Software, Types of Variation, Process Noise ,  Testing for Normality, Normal Probability Plots, Process Drift, The Never Rule, Central Limit Theorem, Simulator Exercise, X bar R Charts, Process Capability, Pattern Analysis, Control Charting Issues, Individual Moving Range Charts, Moving Average Moving Range Charts, Measured & Counted Data, Defects & Defective Units, np, p, c & u Charts, Simulation, Pareto Principle, Pareto Charts, using SPC/PI+ Software. Control Activity, Steps in Developing a Control Plan, Improvement Activity, Improvement Process

3.  Measurement System Capability Studies
Measurement Systems, Rounding, Discrimination, Sources of Variation, Accuracy, Repeatability, Reproducibility, Stability, Linearity,  Short Method Capability Study, long Method Capability Study , Examples, Forms

4.  Tests of Significance, Correlation &Regression:
Sums, Differences, Application to Measurement systems, Tests of Significance, t tests, ANOVA, one way, Correlation, Coefficient, Scatterplots, Multiple Regression

5. Advanced Control Charts & Autocorrelation
Assumptions That Underlie Shewhart Charts, Process Industry Problems, Rational Subgrouping, Dealing with Non Normal Data, Charts for non Normal Data, Average Run Length Calculations, Dupont's Story, CUSUM Charts, Algorithmic CUSUM, ARL's, The EWMA Chart, Autocorrelation, Coefficients, The Correlogram,  Dealing with Positive Autocorrelation, EWMA Predict Chart, Using SPC/PI+ Software.

Seminar Materials

Participants will receive a copy of The SPC BOOK along with the Seminar Workbook that contains all of the lecture material, and a copy of the SPC/PI+ software manual.